Enhancing emission and conduction of light emitting capacitors by multilayered structures of silicon rich oxide

Thickness-dependent optimization of Er3+ light emission from silicon-rich silicon oxide thin films

This study investigates the influence of the film thickness on the silicon-excess-mediated sensitization of Erbium ions in Si-rich silica. The Er3+ photoluminescence at 1.5 μm, normalized to the film thickness, was found five times larger for films 1 μm-thick than that from 50-nm-thick films intended for electrically driven devices. The origin of this difference is shared by changes in the loca...

Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures

During the last years, high-k dielectrics have been studied intensively looking for an alternative material to replace the SiO2 films as gate dielectric in MOS transistors. Different materials and structures have been proposed. An important concern not yet solved, is the interfacial quality between high-k materials and silicon substrate. For this reason, stack structures with SiO2 as an interfa...

Multilayered Amorphous Silicon Structures

investigation of effective parameters on the rigidity of light composite diaphragms (psscb) by fem

در این رساله با معرفی سقف های psscb متشکل از ترکیب ورق های فولادی ذوزنقه ای و تخته های سیمانی الیافی به عنوان سقف های پیش ساخته (سازگار با سیستم سازه ای قاب های فولادی سبک) به بررسی پارامترهای موثر بر صلبیت سقف، پرداخته می شود. در تحقیق حاضر ابتدا به مدل سازی دو نمونه سقف آزمایش شده، به روش اجزاء محدود با استفاده از نرم افزار تحلیلی abaqus ver 6.10 پرداخته شده است. نمونه های ساخته شده تحت اعما...

Green light emission from terbium doped silicon rich silicon oxide films obtained by plasma enhanced chemical vapor deposition.

The effect of silicon concentration and annealing temperature on terbium luminescence was investigated for thin silicon rich silicon oxide films. The structures were deposited by means of plasma enhanced chemical vapor deposition. The structural properties of these films were investigated by Rutherford backscattering spectrometry, transmission electron microscopy and Raman scattering. The optic...